The first International Metrology Congress (CIM) was organised in Bordeaux in 1983 by Pierre Barbier, a renowned metrology expert and founder of the Collège Français de Métrologie (CFM).


The event was created to provide a platform for experts and practitioners in the field of metrology to exchange views on technical challenges, developments in standardisation and emerging innovations.



The Congress was created in response to the increasing demand for standardisation and international cooperation in measurement systems, particularly with the advent of technologies that require more accurate and globally consistent measurements. In its successive editions, CIM has attracted participants from around the world, including representatives from industry, academia and regulatory bodies, to share best practices and address global challenges in metrology.



Today, CIM is a premier biennial event that attracts hundreds of professionals who take advantage of the opportunity to interact with leading metrology experts.